overview

Model ITC55100C is the latest generation of the industry standard series of ITC55100 testers. The system has been designed around a very powerful micro-controller that gives it a timing resolution of 40ns, twenty times faster than the previous model. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging and avalanche times and for the reported peak drain current.

Model ITC55100C has a bipolar gate drive as a standarfeature. The user can set a total gate drive of 

up to 30V and can select how much of the 30V is  positive and how much of it is negative. This feature ensures that the device is held off during avalanche 

as required for certain devices.

The ITC55100C performs several types of tests that conform to MIL-STD-750E Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load.

test modes

• Single-Pulse Unclamped Inductive Switching (UIS)

• Single-Pulse Avalanche Stress (EAS)

• Repetitive Avalanche Energy (EAR)

• Repetitive Pulse to Failure (RPF)

tests performed

• Continuity test of device socket and/or contacts

• DC zero gate bias Drain-to-Source leakage test

- pre and post avalanche

• Functional device test

• Avalanche test

features

• Single/Dual Device Testing

• N channel, P channel, Mixed

• All Solid State Switching – No Relays

• Timing Resolution of 40ns

• Current Range: 0.1A to 200A, 0.1A Steps

• Avalanche Voltage to 2500V

• Bipolar Gate Drive with 30V swing

• New High Efficiency Kelvin Circuit

• Touch-Screen Program Entry/Control

• Waveform Capture/Display

• Internal Test Program Storage (20 files)

• High Speed Inductor Charging, Reduces Test Time

• Programmable Leakage Test Voltage

• Pre/Post Avalanche Leakage Test

• Avalanche Collapse Test

• Versatile Test Handler Control

• Up to 15 Hardware Sort Bins

• Improved Voltage/Current Accuracy

• Software Updates via Flash Download

• Password Control of Parameter Entry

• Operates with all ITC Inductor Load Boxes

• Interfaces with ITC55MUX4 & ITC55-RSF

• Simple, Complete User Calibration

• Built-in Self Test

safety features

• Test time-out

• Excessive leakage shutdown

• External safety lockout

• Two parallel connected Manual Start push buttons

• Device currents are constantly monitored. Testing is terminated if currents exceed or fail to reach

programmable levels in a specified or calculatedST5000C 5300C IV特性曲线分析仪 Next:ST5300HX分立器件测试仪